Author: claimsbot

1. A nonchromate rust preventive agent for aluminum
which comprises a zirconium compound, a fluoride ion, a water-soluble resin and an aluminum salt,
the concentration of said zirconium compound being 100 to 100000 ppm as zirconium ion,
the concentration of said fluoride ion being 125 to 125000 ppm,
the concentration of said water-soluble resin being 100 to 100000 ppm on a nonvolatile matter basis,
and the concentration of said aluminum salt being 10 to 10000 ppm as aluminum ion.
2. The nonchromate rust preventive agent for aluminum according to claim 1
wherein a fluorozirconic acid andor an ammonium fluorozirconate areis used as said zirconium compound.
3. The nonchromate rust preventive agent for aluminum according to claim 1 or 2
wherein said water-soluble resin has a functional group capable of binding to a zirconium compound andor aluminum in film formation.
4. A method for nonchromate rust prevention of aluminum
which comprises treating an aluminum substrate with the nonchromate rust preventive agent according to any of claims 1 to 3 to form the film in the weight range of 10 to 1000 mgm2 in terms of zirconium.
5. An aluminum product as obtainable by a rust preventive treatment using the nonchromate rust preventive agent according to any of claims 1 to 3.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. An image forming apparatus comprising:
a photosensitive member;
a beam generating means for generating a light beam;
a scanner which reflects the light beam generated from the beam generating means toward the photosensitive member and exposes the photosensitive member by scanning the photosensitive member in a main scanning direction with the light beam;
an exposure position setting means for setting a position of an exposure area by beam scanning of the scanner as an additional value of a first setting value which is set in a first unit corresponding to the scanning of a pixel clock period and a second setting value which is set in a second unit corresponding to the scanning of the period smaller than the pixel clock period;
a first control means for controlling the beam generating means and the scanner so as to expose the area set by the exposure position setting means;
a sensor which detects a position in the main scanning direction of the area exposed by the first control means;
a second control means for controlling the exposure position setting means so that the exposure position detected by the sensor becomes an objective position, the second control means having a means for increasing the first setting value by one unit and changing the second setting value to a first predetermined value in the case that the additional value of the exposure position setting means is increased to reach a first threshold, and a means for decreasing the first setting value by one unit and changing the second setting value to a second predetermined value in the case that the additional value of the exposure position setting means in which the first setting value has been increased by one unit is decreased to reach a second threshold smaller than the first threshold, wherein the second threshold is separated from the first threshold by a distance corresponding to a value in which the first predetermined value is added to the value of the second unit corresponding to the scanning of the pixel clock period;
a means for determining an image forming area on the photosensitive member on the basis of the first setting value and the second setting value of the exposure position setting means and forming an electrostatic latent image corresponding to input image data on the image forming aria using the beam generating means; and
a developer which develops the latent image formed on the photosensitive member with developing agent.
2. An image forming apparatus comprising:
a photosensitive member;
a beam generating means for generating a light beam;
a scanner which reflects the light beam generated from the beam generating means toward the photosensitive member and exposes the photosensitive member by scanning the photosensitive member in a main scanning direction with the light beam;
an exposure position setting means for setting a position of an exposure area by beam scanning of the scanner as an additional value of a first setting value which is set in a first unit corresponding to the scanning of a pixel clock period and a second setting value which is set in a second unit corresponding to the scanning of the period smaller than the pixel clock period;
a first control means for controlling the beam generating means and the scanner so as to expose the area set by the exposure position setting means;
a sensor which detects a position in the main scanning direction of the area exposed by the first control portion;
a second control means for controlling the exposure position setting means so that the exposure position detected by the sensor becomes an objective position, the second control means having a means for changing the second setting value to a value in which a multiple value of the second unit corresponding to the scanning of the pixel clock period is multiplied by a multiple of a predetermined number of the first unit in the case that the second setting value is increased to a value more than the value corresponding to the multiple of the predetermined number of the first unit;
a means for determining an image forming area on the photosensitive member on the basis of the first setting value and the second setting value of the exposure position setting means and forming an electrostatic latent image corresponding to input image data on the image forming area using the beam generating means; and
a developer which develops the latent image formed on the photosensitive member with developing agent.
3. An image forming apparatus comprising:
a photosensitive member;
a beam generating means for generating a light beam;
a scanner which reflects the light beam generated from the beam generating means toward the photosensitive member and exposes the photosensitive member by scanning the photosensitive member in a main scanning direction with the light beam;
an exposure position setting means for setting a position of an exposure area by beam scanning of the scanner as an additional value of a first setting value which is set in a first unit corresponding to the scanning of a pixel clock period and a second setting value which is set in a second unit corresponding to the scanning of the period smaller than the pixel clock period;
a first control means for controlling the beam generating means and the scanner so as to expose the area set by the exposure position setting means;
a sensor which detects a position in the main scanning direction of the area exposed by the first control portion;
a second control means for controlling the exposure position setting means so that the exposure position detected by the sensor becomes an objective position, the second control means having a means for setting the second setting value to a value of a predetermined ratio to the maximum value of the second setting value, deciding the first setting value in which the position in the main scanning direction of the area exposed by the first control portion substantially corresponds to the objective position, fixing the first setting value to the decided value, and changing the second setting value according to the shift of the exposure position from the objective position;
a means for determining an image forming area on the photosensitive member on the basis of the first setting value and the second setting value of the exposure position setting means and forming an electrostatic latent image corresponding to input image data on the image forming area using the beam generating means; and
a developer which develops the latent image formed on the photosensitive member with developing agent.

1. A system comprising:
a clock synchronization component configured to generate a clock signal for the system;
one or more input components configured to receive a signal from an automated testing equipment at a first slew rate configured to test an integrated circuit;
one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment;
a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and
one or more output components configured to convey the test signal to the integrated circuit at a second slew rate faster than the first slew rate, the integrated circuit being separable from the one or more output components.
2. The system of claim 1, further including a command generating component configured to control timing of commands to be sent to the integrated circuit.
3. The system of claim 1, further including an address generating component configured to generate an address to be sent to the integrated circuit.
4. The system of claim 1, further including the integrated circuit.
5. The system of claim 1, wherein the one or more data generating components include a test plan memory component configured to store a test plan for testing a set-up time or a hold time of the integrated circuit.
6. A method comprising:
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
attaching the integrated circuit to be tested to the test module;
receiving, at the test module, a signal from the automated testing equipment at a first slew rate;
testing the integrated circuit according to the steps of:
(a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization,
(c) receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) comparing the received data to an expected result.
7. The method of claim 6, further comprising repeating steps (a), (b), (c), and (d), using a different adjustment to the clock synchronization.
8. The method of claim 7, wherein the test module is configured to test a minimum set-up time of the integrated circuit.
9. The method of claim 7, wherein the test module is configured to test a minimum hold time of the integrated circuit.
10. The test method of claim 7, further comprising generating the test signal within the test module responsive to the signal received from the automated testing equipment.
11. The method of claim 10, wherein the test signal includes at least one command.
12. The method of claim 10, wherein the test signal includes at least one address.
13. The method of claim 6, wherein the adjustment to the clock synchronization is configured to test the hold time of the integrated circuit.
14. A system comprising:
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
means for configuring the test module for testing of the integrated circuit;
means for receiving, at the test module, a signal from the automated testing equipment at a first slew rate; and
means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of:
a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
b) means for conveying a test signal to the integrated circuit, at a second slew rate faster than the first slew rate, using the adjustment to the clock synchronization,
c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and
d) means for comparing the received data to an expected result.
15. A system comprising:
a clock synchronization component configured to generate a clock signal for the system;
one or more input components configured to receive a signal from an automated testing equipment at a first clock frequency configured to test an integrated circuit;
one or more data generating components configured to generate a test signal responsive to the signal received from the automated testing equipment;
a clock adjustment component configured to test a parameter of the integrated circuit by adjusting synchronization between the clock signal that is generated by the clock synchronization component and the test signal to be conveyed to the integrated circuit; and
one or more output components configured to convey the test signal to the integrated circuit at a second clock frequency higher than the first clock frequency, the integrated circuit being separable from the one or more output components.
16. The system of claim 15, further including a command generating component configured to control timing of commands to be sent to the integrated circuit.
17. The system of claim 15, further including an address generating component configured to generate an address to be sent to the integrated circuit.
18. The system of claim 15, further including the integrated circuit.
19. The system of claim 15, wherein the one or more data generating components include a test plan memory component configured to store a test plan for testing a set-up time or a hold time of the integrated circuit.
20. A method comprising:
attaching an automated testing equipment to a test module having a clock adjustment component configured to determine a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
attaching the integrated circuit to be tested to the test module;
receiving, at the test module, a signal from the automated testing equipment at a first clock frequency;
testing the integrated circuit according to the steps of:
(a) generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization,
(c) receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) comparing the received data to an expected result.
21. The method of claim 20, further comprising repeating steps (a), (b), (c), and (d), using a different adjustment to the clock synchronization.
22. The method of claim 21, wherein the test module is configured to test a minimum set-up time of the integrated circuit.
23. The method of claim 21, wherein the test module is configured to test a minimum hold time of the integrated circuit.
24. The test method of claim 21, further comprising generating the test signal within the test module responsive to the signal received from the automated testing equipment.
25. The method of claim 24, wherein the test signal includes at least one command.
26. The method of claim 24, wherein the test signal includes at least one address.
27. The method of claim 20, wherein the adjustment to the clock synchronization is configured to test the hold time of the integrated circuit.
28. A system comprising:
means for coupling a test module having a clock adjustment component between an automated testing equipment and an integrated circuit to be tested, the clock adjustment component comprising means for determining a clock synchronization between a clock signal sent to an integrated circuit and a clock signal used to determine when to expect data from the integrated circuit;
means for configuring the test module for testing of the integrated circuit;
means for receiving, at the test module, a signal from the automated testing equipment at a first clock frequency; and
means for testing a slew rate, minimum set-up time, or minimum hold time of the integrated circuit according to the steps of:
(a) means for generating an adjustment to the clock synchronization responsive to the signal received from the automated testing equipment,
(b) means for conveying a test signal to the integrated circuit, at a second clock frequency higher than the first clock frequency, using the adjustment to the clock synchronization,
(c) means for receiving data from the integrated circuit responsive to the conveyed test signal, and
(d) means for comparing the received data to an expected result.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. A waterproofing structure for a drive device including: a power supply unit; and a drive unit formed to protrude from one end of said power supply unit and to be activated with an electric power supplied from said power supply unit, comprising:
a power supply unit cover formed to have an opening at its one end and to cover said power supply unit in a water-tight state; and
a drive unit cover formed to have an opening at its one end and to cover said drive unit in a water-tight state,
wherein said power supply unit includes at its one end:
a supporting cylinder unit formed to protrude to the side of said drive unit; and
a protecting cylinder unit formed outside of the diameter of and at a predetermined spacing size from said supporting cylinder unit, and
wherein said drive unit cover has its opening edge portion fitted in a water-tight state between said supporting cylinder unit and said protecting cylinder unit so that the opening circumferential edge portion of said drive unit cover and said protecting cylinder unit in a water-tight state with the opening edge portion of said power supply unit cover.
2. A waterproofing structure according to claim 1,
wherein the opening edge portion of said drive unit cover has a ridge portion formed along the outside of the side edge of said opening edge portion for holding the water-tight state inside of said drive unit cover when press-fitted between said supporting cylinder unit and said protecting cylinder unit.
3. A waterproofing structure according to claim 2,
wherein said drive unit cover is made of a waterproof material having an extensibility and has an internal diameter size substantially equal to the external diameter size of said supporting cylinder unit, and
wherein said ridge portion has an external diameter size substantially equal to the internal diameter size of said protecting cylinder unit.
4. A waterproofing structure according to claim 2,
wherein said power supply unit cover is made of a waterproof material having an extensibility and has an internal diameter size slightly larger than the external diameter size of said power supply unit, and
wherein the opening edge portion of said power supply unit cover has an engaging ridge portion formed smaller than the internal diameter size of said protecting cylinder unit.
5. A waterproofing structure according to claim 1,
wherein said power supply unit cover is made of a soft material and disposed at said power supply unit for operating a switch unit disposed to control said drive unit.
6. A waterproofing structure according to claim 1,
wherein said power supply unit is formed of a battery box, and
wherein said power supply unit cover can be removed, if necessary.
7. A waterproofing structure according to claim 3,
wherein said drive unit includes a prime mover, and a vibrator formed to vibrate in association with said prime mover, and
wherein said switch unit is configured with push buttons.
8. A waterproofing structure according to claim 5,
wherein said switch unit is configured with a dial.
9. A waterproofing structure according to claim 5,
wherein said switch unit is configured with a slider.