Author: claimsbot

1. A cosmetic case, comprising:
a case body,
an associated lid opening and closing the case body;
an exchangeable cover replaceably attached to either the lid or the case body to cover the lid or the case body, the exchangeable cover being configured to be slidable in a direction substantially parallel to a top surface of either the lid or the case body;
a slide engagement member provided cooperatively between either the lid or the case body and the exchangeable cover to permit the exchangeable cover to slide into an attaching position where the exchangeable cover is detachably attached to either the lid or the case body;
a fastening member provided cooperatively between either the lid or the case body and the exchangeable cover to permit either the lid or the case body to hold and release the exchangeable cover along its sliding direction; and
a dent provided adjacent to the slide engagement member for permitting the exchangeable cover to detach from the lid or the case body,
wherein the slide engagement member has a concave portion provided in either the exchangeable cover or one of the lid or the case body along a sliding direction of the cover, and a convex portion provided in either the lid or the case body or the exchangeable cover and configured to slidably fit in the concave portion,
wherein the fastening member is a detachable projection elastically deformable in the concave portion and detachably mated with the convex portion, and
wherein the concave and convex portions are provided in positions as desired along the sliding direction of the exchangeable cover, and the concave portion has the dent configured to detachably fit in the convex portion.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. An electronic device comprising:
an electronic component;
a metal substrate having a recess which is large enough to fully receive the electronic component and which is defined by a metal outer frame and a metal bottom plate; and
a wiring board having a surface area larger than the area of the opening of the recess and having a wiring pattern formed on the top surface thereof,
at least a portion of the surface of the wiring board being fixed to the bottom surface of the metal substrate, and
the electronic component being mechanically fixed to the bottom of the recess while being electrically connected to the wiring pattern,
wherein the metal substrate comprises a window that is opened from the bottom of the recess through to the bottom surface thereof, wherein the wiring board is fixed to the bottom surface of the metal substrate so that a portion of the wiring pattern is exposed in the recess through the window, and wherein the electronic component is electrically connected to the wiring pattern exposed in the recess through the window using a bonding wire.
2. An electronic device as claimed in claim 1, wherein the wiring board comprises another wiring pattern on the bottom surface thereof, and wherein the wiring pattern on the top surface of the wiring board is electrically connected to the wiring pattern on the bottom surface of the wiring board via a contact formed through the wiring board.
3. An electronic device as claimed in claim 1, further comprising a metal lid fixed to close the opening of the recess.
4. An electronic device as claimed in claim 1, wherein the wiring board is fixed to the top surface of the metal substrate in a manner such that the wiring board closes the opening of the recess, and wherein the electronic component is connected to the wiring pattern using flipchip bonding.
5. An electronic device as claimed in claim 1, wherein the wiring board is fixed to the metal substrate using one of diffusion bonding and fusion boding, in which a surface treatment film made of gold, silver, tin, or a combination thereof is formed on each of a surface area of the wiring pattern and a surface area of the metal substrate to be bonded together and the surface treatment film of the wiring pattern and the surface treatment film of the metal substrate are forced into contact under a predetermined condition.
6. An electronic device as claimed in claim 1, wherein the full bottom surface of said electronic component is in contact to define said recess.
7. An electronic device as claimed in claim 1, wherein said metal substrate has a metal plate attached to said electronic component.
8. An electronic device as claimed in claim 4, wherein the metal substrate comprises a main substrate portion having a through hole that is opened from the top surface to the bottom surface, and a metal lid that closes the opening of the through hole on one side of the through hole to produce the recess from the through hole.
9. An electronic device as claimed in claim 7, wherein said metal plate fully covers the bottom surface of said electronic component.
10. An electronic device as claimed in claim 7, wherein said metal plate is wider than said electronic component.

1. A method of data recovery in a first computer processing environment, where data has been stored in a data store different from a data source in the first processing environment, the method comprising:
initiating a data recovery operation;
recovering given data to a former state as reflected in a data store, wherein the recovery comprises:
presenting a structure of the given data to an application associated with a data source so that, from a point-of-view of the application, the data source is recovered prior to fully recovering the given data; and
continuing to recover the given data; and

enabling the application to continue accessing or updating the given data during the recovery.
2. The method of claim 1, wherein enabling the application to continue updating the given data during the recovery comprises capturing application events.
3. The method of claim 1, wherein the data source is a database.
4. The method of claim 3, wherein enabling the application to continue updating the given data during the recovery comprises capturing database events.
5. The method of claim 4, further comprising updating the data store with the database events.
6. The method of claim 1, wherein the data source is an email server.
7. The method of claim 1, wherein the application is an operating system.
8. The method of claim 1, wherein the data source comprises at least a directory of files and a subdirectory of files.
9. An apparatus for providing a data recovery service in a first processing environment, where data has been stored in a data store different from a data source in the first processing environment, comprising:
a processor; and
code executable by the processor to:
initiate a data recovery operation;
recover given data to a former state as reflected in a data store, wherein the recovery comprises:
presenting a structure of the given data to an application associated with a data source so that, from a point-of-view of the application, the data source is recovered prior to fully recovering the given data; and
continuing to recover the given data; and

enable the application to continue accessing or updating the given data during the recovery.
10. The apparatus of claim 9, further comprising a host driver that captures application events to enable the application to continue updating the given data during the recovery.
11. The apparatus of claim 9, further comprising a filter driver, wherein the filter driver captures application events to enable the application to continue updating the given data during the recovery.
12. The apparatus of claim 9, wherein the data source is a database.
13. The apparatus of claim 12, further comprising a host driver that captures database events to enable the application to continue updating the given data during the recovery.
14. The apparatus of claim 12, further comprising a filter driver that captures database events to enable the application to continue updating the given data during the recovery.
15. The apparatus of claim 13, wherein the code executable by the processor further comprises updating the data store with the database events.
16. The apparatus of claim 14, wherein the code executable by the processor further comprises updating the data store with the database events.
17. The apparatus of claim 9, wherein the data source is an email server.
18. The apparatus of claim 9, wherein the application is an operating system.
19. The apparatus of claim 9, wherein the data source comprises at least a directory of files and a subdirectory of files.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

1. An analysis system for analysis of a liquid sample on an analytical test element, comprising an evaluation appliance for evaluation of electrical signals, a test element holder configured to hold and position an analytical test element in a measurement position within the analysis system, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element provided in the test element holder to produce an electrical connection between the contact surface and the evaluation appliance, wherein the at least one contact element is arranged such that it can move relative to the test element holder, and wherein the analysis system has a means for moving the electrical contact element into contact with the contact surface when the test element is positioned in the measurement position in the test element holder.
2. The analysis system of claim 1, wherein the contact element is moveable at substantially right angles to the contact surface.
3. The analysis system of claim 2, wherein the means for moving the contact element comprises rotary movement of the contact element towards the contact surface.
4. The analysis system of claim 1, further comprising a housing, the test element holder and the contact element being provided in said housing, and the test element holder being moveable relative to the housing.
5. The analysis system of claim 4, the test element holder and the contact element comprising an electrical connection system for producing an electrical connection between the evaluation appliance and a test element held within the test element holder, the test element holder comprising a slide that is moveable between an initial position and an end position within the housing, the end position comprising the measurement position, the slide defining a holding space bounded by a stop and configured to receive a test element through an inlet opening in the slide, wherein the electrical connection system is configured such that the contact element is set at a distance from the contact surface of the test element when the test element is held in the holding space and the slide is in the initial position, and such that the means for moving the contact element causes the contact element to be pressed against the contact surface when the slide is in the end position in order to produce and electrical connection between the contact surface and the evaluation appliance.
6. The analysis system of claim 5, the contact element being at least partially mounted on the slide.
7. The analysis system of claim 6, the contact element being mounted on the slide and recessed relative to the test element in a depression in the holding space when the slide is in the initial position.
8. The analysis system of claim 7, the contact element extending through and being moveably maintained within an opening in the slide, the means for moving the contact element comprising a contact-pressure element fixedly mounted within the housing and outside the slide.
9. The analysis system of claim 8, the contact-pressure element having a guide surface configured to displace the contact element into the holding space toward the contact surface as the slide is moved from the initial position to the end position.
10. The analysis system of claim 9, the contact-pressure element comprising an inclined plane configured to guide the contact element as the slide is moved from the initial position to the end position.
11. The analysis system of claim 8, the contact-pressure element comprising an electrically conductive material and being in electrical communication with the evaluation appliance.
12. The analysis system of claim 6, the contact element also being partially fixedly mounted on the housing and being resiliently flexible and configured such that movement of the slide from the initial position to the end position resiliently deforms the contact element into contact with the contact surface.
13. The analysis system of claim 6, the contact element also being resiliently flexible and comprising one end that contacts an electrical contact in electrical communication with the evaluation appliance when the slide is in the end position, and an other end that is resiliently deformed toward the contact surface when the slide is in the end position by a contact-pressure element fixedly mounted to the housing, the contact-pressure element comprising the means for moving the contact element.
14. The analysis system of claim 6, the contact element being rotatably mounted to the slide, the means for moving the contact element comprising an electrical contact in electrical communication with the evaluation appliance, the contact element comprising one end that contacts the electrical contact when the slide is in the end position and which contacting causes an other end of the contact element to rotate towards the contact surface.
15. The analysis system of claim 1, further comprising a housing, the test element holder and the contact element being provided with the housing, and the test element holder being fixed relative to the housing.
16. The analysis system of claim 15, further comprising a test element magazine for holding at least two test elements, and a test element removal device for removal of a test element from the test element magazine and for transport of the test element to the measurement position in the test element holder.
17. The analysis system of claim 16, the test element removal device comprising a drive operatively connected to the means for movement of the contact element.
18. The analysis system of claim 16, wherein the contact element comprises a toggle lever, and the means for moving the contact element comprises a rod moveable in the substantially longitudinal direction and having a rod end by means of which the contact element can be moved to the contact surface of a test element which is positioned in the measurement position in the test element holder.
19. The analysis system of claim 1, wherein the evaluation appliance comprises an electrochemical evaluation circuit configured to perform analysis of the liquid sample on the test element based at least partially on the electrical signals transmitted from the test element.
20. A method for analysis of a liquid sample on an analytical test element, comprising the steps of: moving the analytical test element to a measurement position in a test element holder in an analysis system; moving a contact element relative to the test element holder towards a contact surface of the test element in order to make electrical contact with the analytical test element and in order to produce an electrical connection between the contact surface and an evaluation appliance; and, using the evaluation appliance, evaluating an electrical signal which is transmitted from the test element via the contact surface and the contact element.
21. The method of claim 20, wherein the test element holder is fixed relative to a housing for containing the analysis system.
22. A method for electrical connection of a contact surface of a test element in an evaluation appliance for an analysis system, comprising the steps of: inserting the test element into a holding space as far as a stop in a slide which is arranged in a housing, the slide being moveable between an initial position and an end position, the slide being located in the initial position at the inserting step and a contact element being provided in the evaluation appliance and set at a distance from the contact surface when the slide is in the initial position; and moving the slide with the test element contained in it from the initial position into the end position, with the contact element being moved towards the contact surface of the test element and pressed against the contact surface when the slide is moved into the end position.