Author: claimsbot

1. A solar photovoltaic junction box for being electrically connected to a solar cell array comprising a plurality of solar cell strings each comprising a plurality of solar cell panels series-connected so as to collect and output power generated by each of the solar cell strings, comprising:
a plurality of input branch lines electrically connected to the solar cell strings,
an output aggregate line that converges the plurality of branch lines to collect power inputted from each of the solar cell strings through the plurality of branch lines and to output the power,
a back-flow preventing diode provided on each of the branch lines to block a current flowing from the aggregate line toward the solar cell string;
a capacitor parallel connected to each of the back-flow preventing diodes;
an AC voltage generator provided on the aggregate line to allow an AC voltage to be applied to the solar cell array through the aggregate line, the branch lines and the capacitor,
a measuring means for measuring an alternating current flowing in the solar cell array; and
a control unit comprising an malfunction determination portion for determining a malfunction in the solar cell array on the basis of the AC voltage applied by the AC voltage generator and the alternating current measured by the measuring means.
2. The solar photovoltaic junction box according to claim 1, wherein the measuring means is configured to measure an alternating current flowing in the aggregate line, and
wherein the malfunction determination portion is configured to determine a malfunction in the solar cell array on the basis of the AC voltage applied by the AC voltage generator and the alternating current measured by the measuring means.
3. The solar photovoltaic junction box according to claim 1, wherein the measuring means is configured to measure an alternating current flowing in each of the branch lines, and
wherein the malfunction determination portion is configured to individually determine a malfunction in the solar cell strings on the basis of the AC voltage applied by the AC voltage generator and the alternating current flowing in each of the branch lines that are measured by the measuring means.
4. The solar photovoltaic junction box according to claim 1, wherein the measuring a s is configured to measure an alternating current flowing in the aggregate line,
wherein the junction box further comprises an inductor parallel-connected to the back-flow preventing diode and series-connected to the capacitor such that the capacitor and the inductor form a band path filter having a passband different in each of the branch lines, and
wherein the malfunction determination portion is configured to select one of the solar cell strings to which AC voltage to be applied by controlling a frequency of the AC voltage applied by the AC voltage generator and to individually determine a malfunction in the solar cell strings by repeatedly determining a malfunction in the selected one of the solar cell strings on the basis of the AC voltage applied by the AC voltage generator and the alternating current measured by the measuring means.
5. The solar photovoltaic junction box according to claim 1, wherein the malfunction determination portion is configured to determine a malfunction in the solar cell array while the solar cell string generates power.
6. The solar photovoltaic junction box according to claim 2, wherein the malfunction determination portion is configured to determine a malfunction in the solar cell array while the solar cell string generates power.
7. The solar photovoltaic junction box according to claim 3, wherein the malfunction determination portion is configured to determine a malfunction in the solar cell array while the solar cell string generates power.
8. The solar photovoltaic junction box according to claim 4, wherein the malfunction determination portion is configured to determine a malfunction in the solar cell array while the solar cell string generates power.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

What is claimed is:

1. A method of using a time of arrival measurement apparatus to measure the time of arrival of a radio signal transmitted by a mobile communication station operating in a wireless mobile communication network, comprising:
providing the time of arrival measurement apparatus with information indicative of a predetermined point in time at which the radio signal is to be transmitted; and
using the time of arrival measurement apparatus to monitor for arrival of the radio signal only during a period of time after said predetermined point in time.

1. Transformable scenery comprising:
a shell wherein at least one discrete portion of the shell is configured to be transformable between one outer appearance and one or more other outer appearances, wherein the one outer appearance and the one or more other outer appearances are three-dimensional, the at least one discrete portion of the shell comprising:
a shaped surface comprising a rigid or semi-rigid mesh having a non-uniform shape in cross section; and
a flexible material supported by the shaped surface and the flexible material configured to receive a medium for expanding the flexible material to a first extended position which creates the one or more other outer appearances and to second contracted position adjacent the shaped surface which creates the one outer appearance;

wherein the one outer appearance is a damaged appearance.
2. The scenery of claim 1, wherein the medium comprises air and further comprising at least one air pump communicating via at least one aperture to an interior of the flexible material.
3. The scenery of claim 2, wherein the at least one air pump comprises an air compressor and a vacuum pump and the at least one aperture comprises a plurality of apertures.
4. The scenery of claim 1, wherein the flexible material comprises a bladder.
5. The scenery of claim 4, wherein the shell comprises a predetermined configuration and wherein the one or more other outer appearances include a simulated undamaged configuration.
6. The scenery of claim 5, wherein the bladder comprises an outer surface that is painted or otherwise treated to match the shell.
7. The scenery of claim 6, wherein the bladder comprises a flexible material that is impervious to a fluid disposed therein.
8. The scenery of claim 7, wherein the shell comprises a portion of a vehicle.
9. The scenery of claim 1, wherein the flexible material comprises a material comprising a tensile strength of greater than 40 Mega Pascal.
10. The scenery of claim 1, wherein the flexible material comprises biased tensile properties.
11. The scenery of claim 1, further comprising at least one cavity located proximal to the shaped surface and wherein an outer edge of the flexible material is biased within the cavity.
12. The scenery of claim 11, further comprising at least one spring disposed within the cavity and being connected with an outer edge of the flexible material for biasing the flexible material within the cavity.
13. The scenery of claim 12, further comprising a gasket dimensioned to cover the at least one cavity.
14. The scenery of claim 13, wherein the at least one cavity is disposed peripherally about the shaped surface and the at least one spring comprises a plurality of springs spaced about the periphery of the outer edge of the flexible material.
15. The scenery of claim 14, wherein the shell comprises a portion of a vehicle.
16. The scenery of claim 1, wherein the at least one discrete portion of the shell comprises a plurality of discrete portions of the shell.
17. A method of transforming scenery comprising:
providing a shell having at least one discrete portion, the discrete portion comprising a shaped surface having a rigid or semi-rigid mesh with a non-uniform shape in cross section and locating a flexible material on the shaped surface; and
transforming the at least one discrete portion of the shell between one outer appearance and one or more other outer appearances, wherein the one outer appearance and the one or more other outer appearances are three-dimensional, and wherein the one outer appearance is a damaged appearances.
18. The method of claim 17, wherein transforming at least a portion of the shell between one outer appearance and one or more other outer appearances comprises:
pumping high pressure or low pressure fluid into the flexible material for respectively expanding the flexible material to a first extended position which creates the one or more other outer appearances and to second contracted position adjacent the shaped surface which creates the one outer appearances.
19. The method of claim 18, wherein the shell comprises a predetermined configuration and wherein the one or more other outer appearances include a simulated undamaged configuration.
20. The method of claim 18, wherein transforming at least a portion of the shell between one outer appearance and one or more another outer appearances comprises varying the rate of pumping of the fluid.

The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.

What is claimed is:

1. A system for reducing test time for integrated circuits on a wafer, the system comprising:
means for powering up all die on the wafer;
means for stabilizing the integrated circuits; and
means for testing each die;
said means for powering, said means for stabilizing, and said means for testing being controlled by a circuit and being operable in a respective sequence.
2. The system of claim 1 wherein said means for testing includes means for indexing a test probe from one die to the next.
3. A method of testing integrated circuits on a wafer, the method comprising:
powering up all die on the wafer;
stabilizing said all die on the wafer; and
indexing a wafer tester from one die to a next thereby testing said all die on the wafer.
4. The method of claim 3 wherein said powering up includes supplying power to said all die in parallel.
5. The method of claim 3 wherein said indexing includes immediately testing a die next to one that has been contemporaneously tested.
6. A software system implemented to reduce test time for integrated circuits in a wafer, the software system comprising:
means for confirming that all die on the wafer are powered up;
means for confirming that all die on the wafer are powered up;
means for confirming that said die on the wafer are stabilized subsequent to being powered up; and
means for indexing a wafer tester from one die to another until all said die have been tested.
7. The software system of claim 6 wherein said means for confirming if said all die on the wafer are powered up includes controlling circuitry to power said all die in parallel.
8. The software system of claim 6 wherein said means for confirming if said all die on the wafer are stabilized includes logic means to initiate indexing said wafer tester if and only if said all die are stabilized.
9. The software system of claim 6 wherein said means for indexing includes logic means to end moving the wafer tester if and only if said all die are tested.