1. A method for determining mappings for application integration, the method comprising:
identifying, by one or more computer processors, a plurality of integration templates that each contain a mapping of a first data field to another data field, wherein at least two of the plurality of integration templates map the first data field to different other data fields;
receiving, by the one or more computer processors, a ranking of each of the plurality of integration templates; and
determining, by the one or more computer processors, a preferred mapping of the first data field to a second data field, based, at least in part, on the received ranking.
2. The method of claim 1, wherein said receiving the ranking of the each of the plurality of integration templates includes receiving a ranking from one or more users, wherein the one or more users are operating within an application integration environment.
3. The method of claim 1, further comprising:
determining, by the one or more computer processors, a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates; and
determining, by the one or more computer processors, the preferred mapping of the first data field to the second data field, based, at least in part, on the determined weight.
4. The method of claim 3, wherein said determining the weight of the mapping of the first data field to each of the different other data fields further comprises:
determining, by the one or more computer processors, an overall ranking for each of the plurality of integration templates, wherein the overall ranking is an average ranking for each of the plurality of integration templates containing a mapping of the first data field to each one of the different other data fields; and
summing the overall rankings of each of the plurality of integration templates containing the mapping of the first data field to each one of the different other data fields.
5. The method of claim 1, wherein said determining a preferred mapping of the first data field to the second data field further comprises:
determining, by the one or more computer processors, a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates;
comparing a determined weight of the mapping of the first data field to the second data field to each of a determined weight of the mapping of the first data field to each of the different other data fields; and
determining, by the one or more computer processors, the determined weight of the mapping of the first data field to the second data field is higher than each of the determined weight of the mapping for the first data field to each of the different other data fields.
6. The method of claim 1, wherein an integration template includes mappings for a first data field determined by a user operating within an application integration environment.
7. The method of claim 1, further comprising presenting the determined preferred mapping of the first data field to a user operating within the application integration environment.
8. A computer program product for determining mappings for application integration, the computer program product comprising:
one or more computer-readable tangible storage media and program instructions stored on the one or more computer-readable tangible storage media, the program instructions comprising:
program instructions to identify a plurality of integration templates containing a mapping of a first data field to another data field, wherein at least two of the plurality of integration templates map the first data field to different other data fields;
program instructions to receive a ranking of each of the plurality of integration templates; and
program instructions to determine a preferred mapping of the first data field to a second data field, based, at least in part, on the received ranking.
9. The computer program product of claim 8, wherein said program instructions to receive the ranking of the each of the plurality of integration templates include program instructions to receive a ranking from one or more users, wherein the one or more users are operating within an application integration environment.
10. The computer program product of claim 8, further comprising:
program instructions to determine a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates; and
program instructions to determine the preferred mapping of the first data field to the second data field, based, at least in part, on the determined weight.
11. The computer program product of claim 10, wherein said program instructions to determine the weight of each of the mappings of the first data field to each of the different other data fields further comprise:
program instructions to determine an overall ranking for each of the plurality of integration templates, wherein the overall ranking is an average ranking for each of the plurality of integration templates containing a mapping of the first data field to each one of the different other data fields; and
program instructions to sum the overall rankings of each of the plurality of integration templates containing the mapping of the first data field to each one of the different other data fields.
12. The computer program product of claim 8, wherein said program instructions to determine a preferred mapping of the first data field to the second data field further comprise:
program instructions to determine a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates;
program instructions to compare a determined weight of the mapping of the first data field to the second data field to each of a determined weight of the mapping of the first data field to each of the different other data fields; and
program instructions to determine that the determined weight of the mapping of the first data field to the second data field is higher than each of the determined weight of the mapping for the first data field to each of the different other data fields.
13. The computer program product of claim 8, wherein an integration template includes mappings for a first data field determined by a user operating within an application integration environment.
14. The computer program product of claim 8, further comprising program instructions to perform the determined preferred mapping of the first data field within the application integration environment.
15. A computer system for determining mappings for application integration, the computer system comprising:
one or more computer processors;
one or more computer-readable tangible storage media;
program instructions stored on the one or more computer-readable tangible storage media for execution by at least one of the one or more computer processors, the program instructions comprising:
program instructions to identify a plurality of integration templates containing a mapping of a first data field to another data field, wherein at least two of the plurality of integration templates map the first data field to different other data fields;
program instructions to receive a ranking of each of the plurality of integration templates; and
program instructions to determine a preferred mapping of the first data field to a second data field, based, at least in part, on the received ranking.
16. The computer system of claim 15, wherein said program instructions to receive the ranking of the each of the plurality of integration templates include program instructions to receive a ranking from one or more users, wherein the one or more users are operating within an application integration environment.
17. The computer system of claim 15, further comprising:
program instructions to determine a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates; and
program instructions to determine the preferred mapping of the first data field to the second data field, based, at least in part, on the determined weight.
18. The computer system of claim 17, wherein said program instructions to determine the weight of each of the mappings of the first data field to each of the different other data fields further comprise:
program instructions to determine an overall ranking for each of the plurality of integration templates, wherein the overall ranking is an average ranking for each of the plurality of integration templates containing a mapping of the first data field to each one of the different other data fields; and
program instructions to sum the overall rankings of each of the plurality of integration templates containing the mapping of the first data field to each one of the different other data fields.
19. The computer system of claim 15, wherein said program instructions to determine a preferred mapping of the first data field to the second data field further comprise:
program instructions to determine a weight of each of the mappings of the first data field to each of the different other data fields, based, at least in part, on the received ranking of each of the plurality of integration templates;
program instructions to compare a determined weight of the mapping of the first data field to the second data field to each of a determined weight of the mapping of the first data field to each of the different other data fields; and
program instructions to determine that the determined weight of the mapping of the first data field to the second data field is higher than each of the determined weight of the mapping for the first data field to each of the different other data fields.
20. The computer system of claim 15, wherein an integration template includes mappings for a first data field determined by a user operating within an application integration environment.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. Sample machining device having at least one sample holder, characterized in that the machining device includes a cylindrical milling cutter, the cylindrical milling cutter and the sample holder being movable relative to one another in such a manner that a sample which can be held in the sample holder can be divided by means of the cylindrical milling cutter to produce a free piece and a remainder piece of the sample which can still be held in the sample holder, and in that at least one additional tool is provided in order to produce chips from the remainder piece of the sample.
2. Sample machining device according to claim 1, characterized in that the sample holder can be displaced in the lateral andor vertical direction at least between machining positions of the cylindrical milling cutter and of the additional tool.
3. Sample machining device according to claim 1, characterized in that the cylindrical milling cutter is disposed on a first spindle and the additional tool is disposed on a second spindle.
4. Sample machining device according to claim 1, characterized in that the sample holder is adapted to holding rotationally symmetrical samples, so that a sample center line extends at least substantially parallel to the rotation center line of the cylindrical milling cutter.
5. Sample machining device according to claim 1, characterized in that the sample holder is adapted to holding conical samples, so that a wider foot end of the sample is received in the sample holder and a narrowing sample section protrudes from the sample holder.
6. Sample machining device according to claim 1, characterized in that the sample machining device is adapted to receiving conical samples, a larger end diameter of which is in the range from 36 to 45 millimeters andor a smaller end diameter of which is in the range from 28 to 36 millimeters andor the height of which is in the range from 45 to 65 millimeters.
7. Sample machining device according to claim 1, characterized in that control means are provided for the automatic centering of the additional tool with respect to a clamping region of the sample holder.
8. Sample machining device according to claim 1, characterized in that a control means are adapted for automatic alignment of the additional tool to the remainder piece in order to form chips from a central region, in particular from the center of a surface thereof formed by the cylindrical milling cutter.
9. Sample machining device according to claim 1, characterized in that the at least one additional tool is adapted for removal of chips from a surface of the remainder piece.
10. Sample machining device according to claim 1, characterized in that a purge device for supplying inert gas into at least one milling andor drilling region of the sample machining device is provided.
11. Sample analysis device according to claim 10, characterized in that the inert gas comprises at least one of argon, helium and nitrogen.
12. Sample machining device according to claim 1, characterized in that an extraction device for sucking out chips that are to be produced by means of the additional tool is provided.
13. Sample machining device according to claim 12, characterized in that the extraction device has at least one transport fan which sucks the inert gas out of at least one milling andor drilling region as carrier gas for the chips.
14. Sample analysis device, characterized in that at least one sample machining device according to claim 1 is provided, and in that means for carrying out OES analysis andor XRF analysis andor combustion analysis are provided.
15. Sample analysis device according to claim 14, characterized in that conveying means are provided for transporting the free piece of the sample from the sample machining device to means for carrying out OES analysis andor XRF analysis.
16. Sample analysis device according to claim 15, characterized in that a number of thermal analyzers are provided, adapted for detecting carbon, sulfur, nitrogen and oxygen.
17. Sample analysis device according to claim 16, characterized in that means for pneumatically transporting chips from the sample machining device to the thermal analyzers are provided.
18. Sample analysis device according to claim 17, characterized in that the extraction device is adapted for transporting chips and inert gas as carrier gas from the sample machining device to the thermal analyzers.
19. Sample analysis device according to claim 1, characterized in that the at least one additional tool comprises a drilling or separate milling tool.