1. A heat dissipating module for dissipating heat from an electronic apparatus, comprising:
a housing comprising a partition;
a first fan disposed at a side of the partition; and
a second fan disposed at the other side of the partition and comprising a plurality of wind deflectors, wherein the wind deflectors are higher than the partition.
2. The heat dissipating module according to claim 1, wherein the first fan is an axial flow fan.
3. The heat dissipating module according to claim 1, wherein the second fan is a centrifugal fan.
4. The heat dissipating module according to claim 1, wherein the electronic apparatus is a display card, a central processing unit or a chipset.
5. The heat dissipating module according to claim 1, wherein the wind deflectors are U-shape, V-shape, or semi-circle.
6. The heat dissipating module according to claim 1, wherein the housing further comprises an inlet and an outlet, the first fan is disposed corresponded to the inlet, and the second fan is disposed corresponded to the outlet.
7. The heat dissipating module according to claim 1, wherein the second fan comprises a second shaft and a second impeller, and the first impeller is disposed around the first shaft.
8. The heat dissipating module according to claim 7, wherein the wind deflectors are disposed at one side of the second shaft.
9. The heat dissipating module according to claim 7, wherein the second impeller is disposed lower than the partition.
10. The heat dissipating module according to claim 1, wherein the first fan is connected with a power module and the power module provide a power to the first fan.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. A system for determining whether a portion of a storage device includes a defect, comprising:
a processor configured to:
read data from the portion of the storage device;
correct the read data using a decoder;
obtain reference data associated with the portion;
compare the reference data and the read data to determine a number of error bits and a number of error symbols associated with the portion;
compute an error ratio, wherein the error ratio comprises a ratio of the determined number of error bits to the determined number of error symbols; and
determine whether the portion includes a defect based at least in part on whether the error ratio exceeds a first threshold, wherein the first threshold is selected based at least in art on a first estimated error ratio for a portion of the storage device with a defect, wherein the first estimated error ratio is calculated based on an assumption that half of the bits in a symbol are in error; and
a communication interface coupled to the processor.
2. The system of claim 1, wherein the decoder is a low-density parity-check (LDPC) decoder.
3. The system of claim 1, wherein the portion of the storage device comprises a sector of the storage device.
4. The system of claim 1, wherein the first threshold is selected based at least in part on a second estimated error ratio for a defect-free portion of the storage device, wherein the second estimated error ratio is calculated based on an assumption that a majority of error events associated with the defect-free portion include single-bit errors, di-bit errors, and tri-bit errors.
5. The system of claim 4, wherein the first threshold is selected to be a value between the first estimated error ratio and the second estimated error ratio.
6. The system of claim 1, wherein the processor is further configured to determine whether the portion includes a defect based at least in part on whether the number of error bits exceeds a second threshold.
7. The system of claim 6, wherein the second threshold is determined based at least in part on an estimate of a number of observable error events.
8. The system of claim 6, wherein the second threshold is determined based at least in part on a correction power of an LDPC decoder used for decoding the data associated with the portion.
9. A method for determining whether a portion of a storage device includes a defect, comprising:
reading data from the portion of the storage device;
correcting the read data using a decoder;
obtaining reference data associated with the portion;
comparing the reference data and the read data to determine a number of error bits and a number of error symbols associated with the portion;
computing an error ratio, wherein the error ratio comprises a ratio of the determined number of error bits to the determined number of error symbols; and
determining whether the portion includes a defect based at least in part on whether the error ratio exceeds a first threshold, wherein the first threshold is selected based at least in part on a first estimated error ratio for a portion of the storage device with a defect, wherein the first estimated error ratio is calculated based on an assumption that half of the bits in a symbol are in error.
10. The method of claim 9, wherein the first threshold is selected based at least in part on a second estimated error ratio for a defect-free portion of the storage device, wherein the second estimated error ratio is calculated based on an assumption that a majority of error events associated with the defect-free portion include single-bit errors, di-bit errors, and tri-bit errors.
11. The method of claim 10, wherein the first threshold is selected to be a value between the first estimated error ratio and the second estimated error ratio.
12. The method of claim 9, further comprising determining whether the portion includes a defect based at least in part on whether the number of error bits exceeds a second threshold.
13. The method of claim 12, wherein the second threshold is determined based at least in part on an estimate of a number of observable error events.
14. The method of claim 12, wherein the second threshold is determined based at least in part on a correction power of an LDPC decoder used for decoding the data associated with the portion.
15. A computer program product for determining whether a portion of a storage device includes a defect, the computer program product being embodied in a non-transitory computer readable storage medium and comprising computer instructions for:
reading data from the portion of the storage device;
correcting the read data using a decoder;
obtaining reference data associated with the portion;
comparing the reference data and the read data to determine a number of error bits and a number of error symbols associated with the portion;
computing an error ratio, wherein the error ratio comprises a ratio of the determined number of error bits to the determined number of error symbols; and
determining whether the portion includes a defect based at least in part on whether the error ratio exceeds a first threshold, wherein the first threshold is selected based at least in part on a first estimated error ratio for a portion of the storage device with a defect, wherein the first estimated error ratio is calculated based on an assumption that half of the bits in a symbol are in error.
16. A system for determining whether a portion of a storage device includes a defect, comprising:
a processor configured to:
read data from the portion of the storage device;
correct the read data using a decoder;
obtain reference data associated with the portion;
compare the reference data and the read data to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data;
determine for each of a plurality of windows of the error vector a corresponding number of error bits, wherein a size of one of the plurality of windows is selected based at least in part on a correction power of an LDPC decoder used for decoding the data associated with the portion; and
determine whether the portion includes a defect based at least in part on whether any of the numbers of error bits exceeds a threshold; and
a communication interface coupled to the processor.
17. The system of claim 16, wherein a size of one of the plurality of windows is selected based at least in part on a length of a defect to be detected.
18. A method for determining whether a portion of a storage device includes a defect, comprising:
reading data from the portion of the storage device;
correcting the read data using a decoder;
obtaining reference data associated with the portion;
comparing the reference data and the read data to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data;
determining for each of a plurality of windows of the error vector a corresponding number of error bits, wherein a size of one of the plurality of windows is selected based at least in part on a correction power of an LDPC decoder used for decoding the data associated with the portion; and
determining whether the portion includes a defect based at least in part on whether any of the numbers of error bits exceeds a threshold.
19. A computer program product for determining whether a portion of a storage device includes a defect, the computer program product being embodied in a non-transitory computer readable storage medium and comprising computer instructions for:
reading data from the portion of the storage device;
correcting the read data using a decoder;
obtaining reference data associated with the portion;
comparing the reference data and the read data to determine an error vector, wherein a bit in the error vector with a value one indicates a bit error in the read data;
determining for each of a plurality of windows of the error vector a corresponding number of error bits, wherein a size of one of the plurality of windows is selected based at least in part on a correction power of an LDPC decoder used for decoding the data associated with the portion; and
determining whether the portion includes a defect based at least in part on whether any of the numbers of error bits exceeds a threshold.