1. A mass spectrometry apparatus comprising:
an ion source arranged in a substantially horizontal orientation and from which a quantity of ions may be sourced;
an ion filter device arranged for receiving a stream of ions for filtering thereof; and,
an ion guide arranged so as to guide ions sourced from the ion source toward the ion filter device;
wherein the ion source and the ion filter device are arranged relative to one another so that the profile of the apparatus is reduced so as to minimize the effective footprint of the apparatus.
2. A mass spectrometry apparatus according to claim 1, wherein the ions from the ion source are extracted and arranged to flow along a first intended path of travel, and wherein the ions receivable by the ion filter device are arranged to flow along a second intended path of travel so as to be received by an ion analysis device for spectrometry analysis.
3. A mass spectrometry apparatus according to claim 2, wherein the apparatus is arranged to divert or guide the ions from the first intended path of travel to flow along the second intended path of travel, the arrangement being such that the apparatus has a reduced footprint when supported on a typical supporting surface such as a bench or desk top.
4. A mass spectrometry apparatus comprising:
an ion source from which a quantity of ions may be sourced for providing a stream of ions moving along a first intended path of travel;
an ion filter device provided for receiving a stream of ions moving along a second intended path of travel for filtering the ion stream prior to analysis by an ion analysis device; and,
an ion guide arranged so as to divert ions moving along the first intended path of travel to move along the second intended path of travel;
wherein the first and second intended paths of travel are arranged relative to one another so that the profile of the apparatus in a plane aligned substantially orthogonal to the second intended path of travel is reduced so as to minimise the effective footprint of the apparatus.
5. A mass spectrometry apparatus comprising:
an ion source from which a quantity of ions may be sourced for providing a stream of ions capable of moving along a first intended path of travel;
an ion filter device provided for receiving a stream of ions moving along a second intended path of travel for filtering the ion stream prior to analysis by an ion analysis device; and,
an ion guide arranged so as to divert ions moving along the first intended path of travel to move along the second intended path of travel;
wherein the first and second intended paths of travel are arranged relative to one another so that the profile of the apparatus in a plane aligned substantially horizontally is reduced so as to minimise the effective footprint of the apparatus.
6. A mass spectrometry apparatus according to claim 2, wherein the ion guide comprises any arrangement capable of directing a beam or stream of ions between the first and second intended paths of travel.
7. A mass spectrometry apparatus according to claim 2, wherein the first and second intended paths of travel are generally linear, whereby the first intended path of travel may be a path having a desired direction within a first plane, and the second intended path of travel may be a path having a desired direction within a second plane.
8. A mass spectrometry apparatus according to claim 7, wherein the first and second planes are aligned so as to be substantially orthogonal to one another.
9. A mass spectrometry apparatus according to claim 8, wherein the first plane is aligned so as to be substantially parallel with a horizontal plane, and the second plane is aligned so as to be substantially parallel with a vertical plane.
10. A mass spectrometry apparatus according to claim 2, wherein the distance traveled by ions along the first intended path of travel is substantially smaller than the distance traveled by ions along the second intended path of travel.
11. A mass spectrometry apparatus according to claim 2, wherein the ion filter device comprises a mass filter or mass analyzer arranged to receive a stream of ions from the ion guide for filtering purposes.
12. A mass spectrometry apparatus according to claim 11, wherein the mass analyzer is arranged to receive ions traveling along the second intended path of travel in the direction of the ion analysis device.
13. A mass spectrometry apparatus according to claim 1, wherein the ion filter device may comprise two or more pole elements such as metallic rods arranged in a spaced apart but parallel relationship with one another.
14. A mass spectrometry apparatus according claim 13, wherein the mass analyzer is a quadrupole mass analyzer having four spaced apart but parallel metallic rods.
15. A mass spectrometry apparatus according to claim 1, wherein the ion filter device may be arranged so as to be aligned substantially parallel to a vertical plane, whereby, a longitudinal axis of the ion filter device is arranged so as to be substantially parallel with a vertical plane.
16. A mass spectrometry apparatus according to claim 2, wherein the ion guide comprises an ion optics lens arrangement capable of directing the ion beam from the first intended path of travel to the second intended path of travel.
17. A mass spectrometry apparatus according to claim 2, wherein the ion guide comprises curved elements arranged so as to guide or direct the ion stream between the first and second intended paths of travel.
18. A mass spectrometry apparatus according to claim 17, wherein the curved elements are shaped in a manner that is commensurate with a portion or segment of the intended path of the ion stream.
19. A mass spectrometry apparatus according to claim 2, wherein the apparatus further comprises one or more collisional cells arranged for filtering interfering particles from the ion stream, thereby serving to improve the signal strength of the ion stream at the ion analysis device.
20. A mass spectrometry apparatus according to claim 19, wherein the or each collisional cell is arranged so as to accommodate one or more of the following reaction or collisional gases: ammonia, methane, oxygen, nitrogen, argon, neon, krypton, xenon, helium or hydrogen, or mixtures of any two or more of them, for reacting with ions extracted from the plasma.
21. A mass spectrometry apparatus according to claim 19, wherein the or each collisional cell is placed at any desired location along the first and or second intended paths of travel of the ion stream so as to remove unwanted particles from the ion stream.
22. A mass spectrometry apparatus according to claim 1, wherein the ion source may be provided by an inductively coupled plasma, whereby, the inductively coupled plasma is arranged so as to be orientated in a substantially horizontal plane.
23. A mass spectrometry apparatus according to claim 2, wherein the first and second intended paths of travel are arranged relative to one another so that the profile of a housing in a plane substantially parallel with the first intended path of travel is reduced so as to minimise the effective footprint of the housing.
24. A mass spectrometry apparatus according to claim 2, wherein the first and second intended paths of travel are arranged relative to one another so that the profile of a housing in a plane substantially orthogonal to the second intended path of travel is reduced so as to minimise the effective footprint of the housing.
25. A mass spectrometry apparatus according to claim 1, wherein the ion source may comprise any known apparatus or device capable of providing ions for analysis.
26. A mass spectrometry apparatus according to claim 1, wherein the ion analysis device may include a mass spectrometry ion detector unit.
27. A mass spectrometry apparatus according to claim 2, wherein the apparatus is of the type of an inductively coupled plasma (ICP) mass spectrometer, whereby the ion source comprises an inductively coupled plasma which is aligned so that the first intended path of travel is aligned substantially with a horizontal plane.
28. An inductively coupled plasma mass spectrometry apparatus comprising:
an ion source arranged in a substantially horizontal orientation and from which a quantity of ions may be sourced;
an ion filter device arranged for receiving a stream of ions for filtering thereof; and,
an ion guide arranged so as to guide ions sourced from the ion source toward the ion filter device;
wherein the ion source and the ion filter device are arranged relative to one another so that the profile of the apparatus in a plane aligned substantially horizontally is reduced so as to minimise the effective footprint of the apparatus.
29. An inductively coupled plasma mass spectrometry apparatus comprising:
an ion source from which a quantity of ions may be sourced for providing a stream of ions moving along a first intended path of travel;
an ion filter device provided for receiving a stream of ions moving along a second intended path of travel for filtering the ion stream prior to analysis by an ion analysis device; and,
an ion guide arranged so as to divert ions moving along the first intended path of travel to move along the second intended path of travel;
wherein the first and second intended paths of travel are arranged relative to one another so that the profile of the apparatus in a plane aligned substantially orthogonal to the second intended path of travel is reduced so as to minimise the effective footprint of the apparatus.
30. An inductively coupled plasma mass spectrometry apparatus according to claim 29, wherein the first intended path of travel is aligned substantially with a horizontal plane, and the second intended path of travel is aligned substantially with a vertical plane whereby the stream of ions moving along the second intended path of travel move in a direction substantially upwards relative to the vertical plane.
31. An inductively coupled plasma mass spectrometry apparatus according to claim 29, wherein the ion guide is an ion mirror.
32. An inductively coupled plasma mass spectrometry apparatus according to claim 29, wherein the ion filter device is a quadrupole mass analyzer.
33. An inductively coupled plasma mass spectrometry apparatus according to claim 29, wherein the apparatus further comprises a collisional cell positioned intermediate of the ion guide and the ion filter device.
34. An inductively coupled plasma mass spectrometry apparatus comprising:
an ion source from which a quantity of ions may be sourced for providing a stream of ions moving along a first intended path of travel aligned substantially with a horizontal plane;
a quadrupole mass analyzer for receiving a stream of ions moving along a second intended path of travel for filtering the ion stream prior to analysis by an ion analysis device, the second intended path of travel being aligned substantially with a vertical plane and the stream of ions moving therealong arranged to move in a direction substantially upwards relative to the vertical plane;
an ion mirror arranged so as to divert ions moving along the first intended path of travel to move along the second intended path of travel; and,
a collisional cell positioned intermediate of the ion mirror and the quadrupole mass analyzer; and,
wherein the first and second intended paths of travel are arranged relative to one another so that the profile of the apparatus in a plane aligned substantially orthogonal to the second intended path of travel is reduced so as to minimise the effective footprint of the apparatus.
35. (canceled)
36. (canceled)
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
an electron blocking layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the electron blocking layer and (B) a second portion arranged over the electron blocking layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and
wherein the gate electrode has an opening in which the first portion and the second portion are arranged, and the first portion and the second portion are not electrically connected to the gate electrode.
2. An electron-emitting device according to claim 1, further comprising:
an insulating layer disposed between the gate electrode and the cathode electrode,
wherein the gate electrode is arranged over the cathode electrode,
wherein an opening penetrates the insulating layer and the gate electrode, and
wherein the first portion is exposed in the opening.
3. An electron-emitting device according to claim 2,
wherein an upper end surface of the cathode electrode contacting the electron-emitting film is arranged at a position that is closer to the substrate than an upper end surface of the cathode electrode contacting the electron blocking layer.
4. An electron-emitting device according to claim 1,
wherein a main ingredient of the electron-emitting film is carbon.
5. An electron-emitting device according to claim 1,
wherein the electron-emitting film is one of a diamond-like carbon film and an amorphous carbon film.
6. An electron-emitting device according to claim 1,
wherein the electron blocking layer is an insulating layer or a semiconductor layer.
7. An electron-emitting device according to claim 1,
wherein an emission amount of electrons emitted from the first portion is 10% or less of an emission amount of electrons emitted from the second portion.
8. An electron-emitting device according to claim 1,
wherein resistivity of a connection portion of the electron-emitting film between the second portion and the first portion is at least equal to 102 \u03a9\xb7cm.
9. An electrode source, comprising:
a plurality of arranged electron-emitting devices, each being an electron-emitting device according to claim 1.
10. An image-forming apparatus comprising:
an electron source according to claim 9; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron source.
11. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
a first insulating layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the first insulating layer and (B) a second portion arranged over the first insulating layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and
wherein the gate electrode has an opening in which the first portion and the second portion are arranged, and the first portion and the second portion are not electrically connected to the gate electrode.
12. An electron-emitting device according to claim 11, further comprising:
a second insulating layer disposed between the gate electrode and the cathode electrode,
wherein the gate electrode is arranged over the cathode electrode,
wherein an opening penetrates the second insulating layer and the gate electrode, and
wherein the first portion is exposed in the opening.
13. An electron-emitting device according to claim 11,
wherein an upper end surface of the cathode electrode contacting the electron-emitting film is arranged at a position that is closer to the substrate than an upper end surface of the cathode electrode contacting the electron blocking layer.
14. An electron-emitting device according to claim 11,
wherein a main ingredient of the electron-emitting film is carbon.
15. An electron-emitting device according to claim 11,
wherein the electron-emitting film is one of a diamond like carbon film and an amorphous carbon film.
16. An electron-emitting device according to claim 11,
wherein an emission amount of electrons emitted from the first portion is 10% or less of an emission amount of electrons emitted from the second portion.
17. An electron-emitting device according to claim 11,
wherein a resistivity of a connection portion of the electron-emitting film between the second portion and the first portion is at least 102 \u03a9\xb7cm.
18. An electron source, comprising:
a plurality of arranged electron-emitting devices, each being an electron-emitting device according to claim 11.
19. An image-forming apparatus comprising:
an electron source according to claim 17; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron source.
20. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
an electron blocking layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the electron blocking layer and (B) a second portion arranged over the electron blocking layer and arranged over the cathode electrode, and the second portion being arranged around the first portion,
wherein the gate electrode is not positioned between the second portion and the electron blocking layer, but is positioned above or below the second portion and the electron blocking layer, and
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm.
21. An image-forming apparatus comprising:
an electron-emitting device according to claim 20; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.
22. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
an electron blocking layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the electron blocking layer and (B) a second portion arranged over the electron blocking layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and
wherein the first portion and second portion form a continuous single film.
23. An image-forming apparatus comprising:
an electron-emitting device according to claim 22; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.
24. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
an electron blocking layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the electron blocking layer and (B) a second portion arranged over the electron blocking layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and is connected to the cathode electrode without being electrically connected to the gate electrode.
25. An image-forming apparatus comprising:
an electron-emitting device according to claim 24; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.
26. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
a first insulating layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the first insulating layer and (B) a second portion arranged over the first insulating layer and arranged over the cathode electrode, and the second portion being arranged around the first portion,
wherein the gate electrode is not positioned between the second portion and the first insulating layer, but is positioned above or below the second portion and the first insulating layer, and
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm.
27. An image-forming apparatus comprising:
an electron-emitting device according to claim 26; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.
28. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
a first insulating layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the first insulating layer and (B) a second portion arranged over the first insulating layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and
wherein the first portion and second portion form a continuous single film.
29. An image-forming apparatus comprising:
an electron source according to claim 28; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.
30. An electron-emitting device comprising:
a cathode electrode;
a substrate arranged under the cathode electrode;
a first insulating layer arranged over a part of the cathode electrode;
a gate electrode to which a potential is applied, the potential being higher than a potential which is applied to the cathode electrode for electron emission; and
an electron-emitting film having (A) a first portion arranged over a portion of the cathode electrode which is not covered with the first insulating layer and (B) a second portion arranged over the first insulating layer and arranged over the cathode electrode,
wherein the electron-emitting film has a resistivity that is equal to at least 10 \u03a9\xb7cm, and is connected to the cathode electrode without being electrically connected to the gate electrode.
31. An image-forming apparatus comprising:
an electron-emitting device according to claim 30; and
a light-emitting member that emits light by irradiation of electrons emitted from the electron-emitting device.