1. A machine implemented method for determining an electronic design characteristic based upon a geometric characteristic of an electronic design feature, comprising:
identifying a first concurrent model for a first level of an electronic circuit design of an electronic circuit to be manufactured by a first manufacturing process or technique;
determining a first three-dimensional geometric characteristic for a first feature on the first level;
determining whether a first design requirement for the first level is satisfied based upon the first three-dimensional geometric characteristic; and
displaying a result of determining a first three-dimensional geometric characteristic or storing the result in a tangible machine accessible medium.
2. The machine implemented method of claim 1, further comprises:
identifying a second concurrent model for a second level of the electronic circuit design of the electronic circuit to be manufactured by a second manufacturing process or technique.
3. The machine implemented method of claim 2 further comprising:
determining a second three-dimensional geometric characteristic for a second feature on the second level; and
determining whether a second design requirement for the second level is satisfied based upon the second three-dimensional geometric characteristic.
4. The machine implemented method of claim 2, further comprising:
forwarding a result of determining a three-dimensional geometric characteristic for a feature on the first level to the second level of the electronic circuit design; and
determining whether a second design requirement for the second level is satisfied based upon the first three-dimensional geometric characteristic.
5. The machine implemented method of claim 4 further comprising:
determining whether a third design requirement for the first level and the second level combined is satisfied.
6. The machine implemented method of claim 1, further comprising:
identifying a first characteristic for the first manufacturing process or technique.
7. The machine implemented method of claim 6, in which the first characteristic comprises plasma distribution, temperature distribution, process chemistry distribution, electromagnetic field distribution, or power distribution.
8. The machine implemented method of claim 6, the first characteristic comprising one or more attributes of a processing chamber within which the electronic circuit is to be manufactured.
9. The machine implemented method of claim 6, in which the determining a first three-dimensional geometric characteristic for a first feature on the first level is based upon the first characteristic for the first manufacturing process or technique.
10. The machine implemented method of claim 1, in which the determining a first three-dimensional geometric characteristic comprises:
directly simulating an underlying physics principle of the first process or technique.
11. The machine implemented method of claim 1, in which the determining a first three-dimensional geometric characteristic comprises:
directly simulating the first manufacturing process or technique; and
tuning a result of the directly simulating with information obtained from a patterned test wafer or from a source of limited fidelity.
12. The machine implemented method of claim 1, in which the determining a first three-dimensional geometric characteristic comprises:
determining a first effective three-dimensional geometric characteristic based upon one or more rules determined with information obtained from a patterned test wafer or from a source of limited fidelity.
13. The machine implemented method of claim 2, in which the first manufacturing process or technique or the second manufacturing process or technique comprises a fabrication process or an image processing process or technique, wherein
the fabrication process comprises a deposition, removal, patterning, or property modification process; and
the image processing processor or technique comprises OAI, SRAF, or PSM.
14. The machine implemented method of claim 1, further comprising:
determining a property of the electronic design feature based upon the three-dimensional geometric characteristic of the first feature.
15. The machine implemented method of claim 14, in which the property of the feature comprises a physical property, an electrical property, a thermal property, or a chemical property of the feature.
16. The machine implemented method of claim 1, in which the first design requirement comprises a performance objective or constraint, a manufacturability objective or constraint, or a reliability objective or constraint.
17. The machine-implemented method of claim 1, further comprising:
combining the first concurrent model with statistical variability measured from or produced by an additional model for the first level to produce a distribution of values related to the first geometric characteristic.
18. The machine-implemented method of claim 1, in which a portion of the electronic circuit design is generated by a context simulation method.
19. A computer program product comprising a computer-usable storage medium having executable code to execute a process for accurately determining an electronic design characteristic based upon a geometric characteristic of an electronic design feature, comprising:
identifying a first concurrent model for a first level of an electronic circuit design of an electronic circuit to be manufactured by a first manufacturing process or technique;
determining a first three-dimensional geometric characteristic for a first feature on the first level;
determining whether a first design requirement for the first level (objective or constraint) is satisfied based upon the first three-dimensional geometric characteristic; and
displaying a result of determining a first three-dimensional geometric characteristic or storing the result in a tangible machine accessible medium.
20. A system for accurately determining an electronic design characteristic based upon a geometric characteristic of an electronic design feature, comprising:
means for identifying a first concurrent model for a first level of an electronic circuit design of an electronic circuit to be manufactured by a first manufacturing process or technique;
means for determining a first three-dimensional geometric characteristic for a first feature on the first level;
means for determining whether a first design requirement for the first level is satisfied based upon the first three-dimensional geometric characteristic; and
means for displaying a result of determining a first three-dimensional geometric characteristic or storing the result in a tangible machine accessible medium.
The claims below are in addition to those above.
All refrences to claim(s) which appear below refer to the numbering after this setence.
1. An electronic device comprising:
a display;
a touch panel provided on the display;
a lock controller configured to shift the electronic device to a locked state and configured to cancel the locked state when a touch input in a predetermined position of the touch panel is detected; and
an unlock screen display controller configured to generate an image as a reference of the position of the touch input for cancellation of the locked state, display the image on the display, and control a display form of the image so that the display form corresponding to a first timing is different from the display form corresponding to a second timing.
2. The electronic device according to claim 1, wherein
the unlock screen display controller controls a position of the image as the display form.
3. The electronic device according to claim 1, wherein
the unlock screen display controller controls positions of the image and other objects displayed on the display as the display form.
4. The electronic device according to claim 1, wherein
the unlock screen display controller controls a size of the image as the display form.
5. The electronic device according to claim 1, wherein
the unlock screen display controller controls an angle of the image as the display form.
6. The electronic device according to claim 1, wherein
the unlock screen display controller controls a shape of the image as the display form.
7. The electronic device according to claim 1, wherein
the unlock screen display controller controls at least two of a position, a size, an angle and a shape of the image as the display form.
8. The electronic device according to claim 1, further comprising:
a detection unit configured to detect an attitude of the electronic device; wherein
the unlock screen display controller controls the display form of the image according to a result detected by the detection unit.
9. A recording medium configured to store a program executed in an electronic device equipped with a display and a touch panel provided on the display, comprising:
shifting the electronic device to a locked state;
cancelling the locked state when a touch input in a predetermined position of the touch panel is detected;
generating an image as a reference of the position of the touch input for cancellation of the locked state and displaying the image on the display portion; and
controlling a display form of the image so that the display form corresponding to a first timing is different from the display form corresponding to a second timing.
10. A lock control method comprising:
shifting the electronic device to a locked state;
generating an image as a reference of a position of a touch input on a touch panel for cancellation of the locked state and displaying the image on the display;
controlling a display form of the image so that the display form corresponding to a first timing is different from the display form corresponding to a second timing; and
canceling the locked state when a touch input in a predetermined position of the touch panel is detected.